The Compact JTAG IP from Texas Instruments implements the new IEEE-1149.7 test and debug standard. Endorsed by both MIPI and Nexus5001, Compact JTAG builds upon traditional IEEE 1149.1 (JTAG) boundary scan to provide an enhanced test and debug standard that meets the demands of today’s complex chip designs. cJTAG offers test, debug and instrumentation utilizing only 2 pins (saving 4–6 pins), provides more capabilities than its predecessor 1149.1 JTAG, and maintains full compatibility with existing IEEE 1149.1-based hardware and software.